The photorecombination of highly charged few-electron mercury ions Hg75+ to Hg78+ has been explored with the Heidelberg electron beam ion trap. By monitoring the emitted x rays (65-76 keV) and scanning the electron beam energy (45-54 keV) over the KLL dielectronic recombination (DR) region, the energies of state-selected DR resonances were determined to within ±4 eV (relative) and ±14 eV (absolute). At this level of experimental accuracy, it becomes possible to make a detailed comparison to various theoretical approaches and methods, all of which include quantum electrodynamic (QED) effects and finite nuclear size contributions (for a 1s electron, these effects can be as large as 160 and 50 eV, respectively). In He-like Hg78+, a good agreement between the experimental results and the calculations has been found. However, for the capture into Li-, Be-, and B-like ions, significant discrepancies have been observed for specific levels. The discrepancies suggest the need for further theoretical and experimental studies with other heavy ions along these isoelectronic sequences.
A. J. Gonzalez and J. R. Crespo Lopez-Urrutia and J. P. Braun and G. Brenner and H. Bruhns and A. Lapierre and V. S. Mironov and R. Soria Orts and H. Tawara and M. Trinczek and J. H. Ullrich and A. N. Artemyev and Z. Harman and U. D. Jentschura and C. H. Keitel and J. H. Scofield and I. I. Tupitsyn, "Benchmarking High-Field Few-Electron Correlation and QED Contributions in Hg⁷⁵⁺ to Hg⁷⁸⁺ Ions. I. Experiment," Physical Review A - Atomic, Molecular, and Optical Physics, vol. 73, no. 5, pp. 052710-1 - 052710-10, American Physical Society (APS), May 2006.
The definitive version is available at https://doi.org/10.1103/PhysRevA.73.052710
Keywords and Phrases
Benchmarking; Electrodynamics; Electron Beams; Electron Energy Levels; Heavy Ions; Mercury (Metal); Numerical Methods; Dielectronic Recombination (DR) Region; Few-electron Mercury Ions; Isoelectronic Sequences; Quantum Electrodynamic (QED) Effects; Quantum Theory
International Standard Serial Number (ISSN)
Article - Journal
© 2006 American Physical Society (APS), All rights reserved.
01 May 2006