Abstract
Spatial intensity correlation functions of semicontinuous metal-dielectric films of varying metal concentration, p, were obtained from near-field microscopy. The data shows a transition from propagation to localization and back to propagation of optical excitations with increase in p.
Recommended Citation
K. Seal et al., "Near-Field Intensity Correlations in Semicontinuous Metal Films," Proceedings of the 2005 Quantum Electronics and Laser Science Conference, Institute of Electrical and Electronics Engineers (IEEE), Jan 2005.
The definitive version is available at https://doi.org/10.1109/QELS.2005.1549185
Meeting Name
2005 Quantum Electronics and Laser Science Conference
Department(s)
Physics
Keywords and Phrases
Dielectric Thin Films; Discontinuous Metallic Thin Films; Metal Concentration; Near-Field Intensity Correlations; Near-Field Microscopy; Near-Field Scanning Optical Microscopy; Optical Excitations; Polaritons; Semicontinuous Metal-Dielectric Films; Spatial Intensity Correlation Functions; Surface Plasmons
Document Type
Article - Conference proceedings
Document Version
Final Version
File Type
text
Language(s)
English
Rights
© 2005 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
01 Jan 2005
