Spatial intensity correlation functions of semicontinuous metal-dielectric films of varying metal concentration, p, were obtained from near-field microscopy. The data shows a transition from propagation to localization and back to propagation of optical excitations with increase in p.
K. Seal et al., "Near-Field Intensity Correlations in Semicontinuous Metal Films," Proceedings of the 2005 Quantum Electronics and Laser Science Conference, Institute of Electrical and Electronics Engineers (IEEE), Jan 2005.
The definitive version is available at https://doi.org/10.1109/QELS.2005.1549185
2005 Quantum Electronics and Laser Science Conference
Keywords and Phrases
Dielectric Thin Films; Discontinuous Metallic Thin Films; Metal Concentration; Near-Field Intensity Correlations; Near-Field Microscopy; Near-Field Scanning Optical Microscopy; Optical Excitations; Polaritons; Semicontinuous Metal-Dielectric Films; Spatial Intensity Correlation Functions; Surface Plasmons
Article - Conference proceedings
© 2005 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
01 Jan 2005