The relative photoionization cross sections for cesium atoms selectively excited to the 6P32,122 states have been measured in a triple-crossed-beam experiment. A cesium discharge lamp produced resonant wavelengths of 8521 and 8944 for the excitation process. A Hg-Xe lamp combined with a grating monochromator was used for the actual ionization in the wavelength region from 2500 to 5000. Background counts due to photoionization of ground-state cesium atoms and dimers as well as various surface effects were discriminated against by chopping the excitation light source. The data are compared with results from radiative-recombination measurements in which the fine-structure levels are not resolved and with recent model-potential calculations. The wavelength () dependence of the cross section indicates a 2 dependence at threshold (5000) and a 4 behavior at lower wavelengths. © 1975 The American Physical Society.
K. J. Nygaard et al., "Photoionization Of The 6P32,122 Fine-structure Levels In Cesium," Physical Review A, vol. 12, no. 4, pp. 1440 - 1447, American Physical Society, Jan 1975.
The definitive version is available at https://doi.org/10.1103/PhysRevA.12.1440
Mechanical and Aerospace Engineering
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01 Jan 1975