Abstract
An Elementary Introduction to Surface Electromagnetic Waves (SEW) is Presented. the Emphasis is on Those Features of SEW Which Make Them Useful for Measuring Optical Properties of Thin Layers on Metals. the So-Called Two-Prism Technique for Making Such Measurements is Discussed, Some Preliminary Experimental Results Are Given, and Some Possible Applications Are Presented. © 1975.
Recommended Citation
R. W. Alexander and R. J. Bell, "The Use of Surface Electromagnetic Waves to Measure Materials Properties," Journal of Non-Crystalline Solids, vol. 19, pp. 93 - 103, Elsevier, Jan 1975.
The definitive version is available at https://doi.org/10.1016/0022-3093(75)90075-7
Department(s)
Physics
International Standard Serial Number (ISSN)
0022-3093
Document Type
Article - Journal
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2023 Elsevier, All rights reserved.
Publication Date
01 Jan 1975
