An Elementary Introduction to Surface Electromagnetic Waves (SEW) is Presented. the Emphasis is on Those Features of SEW Which Make Them Useful for Measuring Optical Properties of Thin Layers on Metals. the So-Called Two-Prism Technique for Making Such Measurements is Discussed, Some Preliminary Experimental Results Are Given, and Some Possible Applications Are Presented. © 1975.
R. W. Alexander and R. J. Bell, "The Use of Surface Electromagnetic Waves to Measure Materials Properties," Journal of Non-Crystalline Solids, vol. 19, pp. 93 - 103, Elsevier, Jan 1975.
The definitive version is available at https://doi.org/10.1016/0022-3093(75)90075-7
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01 Jan 1975