Diffraction Analysis of HREM Images from a Plasma-Deposited Iron Carbide Film
The selected area diffraction information in a single high resolution electron microscopy image of iron carbide, plasma-deposited onto a carbon support film at 300 °C was studied. Six areas of the negative that showed cross-fringes were digitized and the interplanar angles of these periodicities were obtained from the respective power spectra. A computer program was then used to measure spacings against all possible indexings for the crystal's various phases. Results indicate that all crystals in the sample region were able to index with spacings for Fe7C3 within 3.5% and 3.5° with no preferred orientation.
H. Siriwardane et al., "Diffraction Analysis of HREM Images from a Plasma-Deposited Iron Carbide Film," Proceedings of the 52nd Annual Meeting of the Microscopy Society of America (1994, New Orleans, LA), pp. 750 - 751, Microscopy Society of America (MSA), Aug 1994.
52nd Annual Meeting of the Microscopy Society of America (1994: Jul. 31-Aug. 5, New Orleans, LA)
Materials Science and Engineering
Keywords and Phrases
Computer Aided Analysis; Crystal Lattices; Crystal Microstructure; Crystal Orientation; Digital Image Storage; Electron Diffraction; Graphitization; Image Analysis; Iron Compounds; Metallographic Phases; Transmission Electron Microscopy; Cross Fringes; High Resolution Electron Microscopy; Iron Carbide; Power Spectra; Carbides
Article - Conference proceedings
© 1994 Microscopy Society of America (MSA), All rights reserved.
05 Aug 1994