Diffraction Analysis of HREM Images from a Plasma-Deposited Iron Carbide Film

Abstract

The selected area diffraction information in a single high resolution electron microscopy image of iron carbide, plasma-deposited onto a carbon support film at 300 °C was studied. Six areas of the negative that showed cross-fringes were digitized and the interplanar angles of these periodicities were obtained from the respective power spectra. A computer program was then used to measure spacings against all possible indexings for the crystal's various phases. Results indicate that all crystals in the sample region were able to index with spacings for Fe7C3 within 3.5% and 3.5° with no preferred orientation.

Meeting Name

52nd Annual Meeting of the Microscopy Society of America (1994: Jul. 31-Aug. 5, New Orleans, LA)

Department(s)

Physics

Second Department

Chemistry

Third Department

Materials Science and Engineering

Keywords and Phrases

Computer Aided Analysis; Crystal Lattices; Crystal Microstructure; Crystal Orientation; Digital Image Storage; Electron Diffraction; Graphitization; Image Analysis; Iron Compounds; Metallographic Phases; Transmission Electron Microscopy; Cross Fringes; High Resolution Electron Microscopy; Iron Carbide; Power Spectra; Carbides

Document Type

Article - Conference proceedings

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 1994 Microscopy Society of America (MSA), All rights reserved.

Publication Date

05 Aug 1994

This document is currently not available here.

Share

 
COinS