Information About TS-1 and TS-2 Double Ionization Mechanisms for Positron and Electron Impact Ionization of Argon

Author

Jared M. Gavin
O. G. de Lucio
Robert D. DuBois, Missouri University of Science and TechnologyFollow

Abstract

Ejected electron angular distributions are measured for single and double ionization of argon by 500 eV positron and electron impact. Double to single ionization ratios show marked differences as a function of projectile charge. Combinations of the positron and electron data and a simple double ionization model are used to obtain differential information about the TS-1 and TS-2 mechanisms. Our analysis suggests that both mechanisms contribute roughly equally to the emission of two electrons and that interference between the two mechanisms significantly alters the ejected electron spectra.

Recommended Citation

J. M. Gavin et al., "Information About TS-1 and TS-2 Double Ionization Mechanisms for Positron and Electron Impact Ionization of Argon," Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, Elsevier, Jan 2009.

The definitive version is available at https://doi.org/10.1016/j.nimb.2008.10.076

Department(s)

Physics

Sponsor(s)

National Science Foundation (U.S.)

Keywords and Phrases

TS-1; TS-2; Electron; Positron; Ionization

Document Type

Article - Conference proceedings

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2009 Elsevier, All rights reserved.

Publication Date

01 Jan 2009