X-Ray Emission from Slow Highly Charged Ar Ions Interacting with a Ge Surface

Author

Michael Schulz, Missouri University of Science and TechnologyFollow
C. Lewis Cocke
Siegbert Hagmann
Martin P. Stockli
Horst Schmidt-Bocking

Abstract

We have measured K x-ray spectra and yields from Ar¹⁷⁺ ions slowly approaching a single-crystal Ge surface. The yields were measured as a function of the projectile velocity component perpendicular to the surface. From the data a characteristic time of approximately 1 psec was extracted for the in-flight filling above the surface of the Ar K vacancy.

Recommended Citation

M. Schulz et al., "X-Ray Emission from Slow Highly Charged Ar Ions Interacting with a Ge Surface," Physical Review A, vol. 44, no. 3, pp. 1653 - 1658, American Physical Society (APS), Aug 1991.

The definitive version is available at https://doi.org/10.1103/PhysRevA.44.1653

Department(s)

Physics

International Standard Serial Number (ISSN)

1050-2947

Document Type

Article - Journal

Document Version

Final Version

File Type

text

Language(s)

English

Rights

© 1991 American Physical Society (APS), All rights reserved.

Publication Date

01 Aug 1991