Abstract
Approaches for deriving scatter information using inverse tracking of scattered X-rays is disclosed. In certain embodiments scattered rays are tracked from respective locations on a detector to a source of the X-ray radiation, as opposed to tracking schemes that proceed from the source to the detector. In one such approach, the inverse tracking is implemented using a density integrated volume that reduces the integration steps performed.
Recommended Citation
X. Wu et al., "Method and System for Scatter Correction in X-Ray Imaging," U.S. Patents, United States Patent and Trademark Office, Jan 2013.
Department(s)
Nuclear Engineering and Radiation Science
Patent Application Number
US13/174,480
Patent Number
US20130004050A1
Document Type
Patent
Document Version
Final Version
File Type
text
Language(s)
English
Rights
© 2013 General Electric Company, All rights reserved.
Publication Date
01 Jan 2013
