In-Situ Luminescence Monitoring of Ion-Induced Damage Evolution in SiO₂ and Al₂O₃
Real-time, in-situ ionoluminescence measurements provide information of evolution of emission bands with ion fluence, and thereby establish a correlation between point defect kinetics and phase stability. Using fast light ions (2 MeV H and 3.5 He MeV) and medium mass-high energy ions (8 MeV O, E=0.5 MeV/amu), scintillation materials of a-SiO2, crystalline quartz, and Al2O3 are comparatively investigated at room temperature with the aim of obtaining a further insight on the structural defects induced by ion irradiation and understand the role of electronic energy loss on the damage processes. For more energetic heavy ions, the electronic energy deposition pattern offers higher rates of excitation deeper into the material and allows to evaluate the competing mechanisms between the radiative and non-radiative de-excitation processes. Irradiations with 8 MeV O ions have been selected corresponding to the electronic stopping regime, where the electronic stopping power is dominant, and above the critical amorphization threshold for quartz. The usefulness of IBIL and its specific capabilities as a sensitive tool to investigate the material characterization and evaluation of radiation effects are demonstrated.
M. L. Crespillo et al., "In-Situ Luminescence Monitoring of Ion-Induced Damage Evolution in SiO₂ and Al₂O₃," Journal of Luminescence, vol. 172, pp. 208-218, Elsevier, Apr 2016.
The definitive version is available at https://doi.org/10.1016/j.jlumin.2015.12.016
Nuclear Engineering and Radiation Science
Keywords and Phrases
Alumina; Aluminum; Characterization; Energy dissipation; Heavy ions; Ion beams; Ion bombardment; Irradiation; Luminescence; Point defects; Quartz; Radiation effects; Silica; Electronic energy deposition; Electronic energy loss; Electronic stopping power; Ion beam induced luminescences; Ion-solid interactions; Irradiation effects; Material characterizations; Scintillation materials; Defects; Lumina
International Standard Serial Number (ISSN)
Article - Journal
© 2016 Elsevier, All rights reserved.
01 Apr 2016