Abstract

Two-dimensional (2D) material of silicon phosphide (SiP) has recently been shown as a promising optical material with large band gap, fast photoresponse and strong anisotropy. However, the nonlinear optical properties of 2D SiP have not been investigated yet. Here, the thickness-dependent in-plane anisotropic third-harmonic generation (THG) from the mechanically exfoliated 2D layered SiP flakes is reported. The crystal orientation of the SiP flake is determined by the angle-resolved polarized Raman spectroscopy. The angular dependence of the THG emission with respect to the incident linear polarization is found to be strongly anisotropic with the two-fold polarization dependence pattern. Furthermore, the effect of the SiP flake thickness on the THG power is analyzed.

Department(s)

Mechanical and Aerospace Engineering

Comments

National Science Foundation, Grant 1552871

International Standard Serial Number (ISSN)

2045-2322

Document Type

Article - Journal

Document Version

Final Version

File Type

text

Language(s)

English

Rights

© 2021 The Authors, All rights reserved.

Publication Date

01 Dec 2021

PubMed ID

33737690

Share

 
COinS