A Study Of The Recrystallization Of Cold-worked Copper By Doppler Broadening Of Annihilation Radiation
The recrystallization of oxygen-free high-conductivity copper cold rolled to 20, 37, 55 and 66% thickness reductions has been studied by monitoring the extent of Doppler broadening of the positron annihilation γ linewidth as a function of temperature during ramp annealing runs. The sharp change in the line-shape parameter S consistently observed between 100 and 200°C is attributed to the reduction in defect densities during recrystallization. These temperatures are about 100-200°C below those reported in earlier studies; this may be a consequence of the relatively low rate of temperature increase during annealing (2.2-50°C h−1), the purity of the samples used or the sample preparation history. The temperature at which recrystallization is seen to occur passes through a maximum at about 40% deformation. A measurement of S for the 20%-deformed sample as a function of time at a constant temperature implies that the recrystallization is a first-order process which follows an incubation period and which is in turn followed by grain growth. Recrystallized grain sizes have been measured for all samples and found to lie in a small range between 10 and 12.5 μm. These results are discussed in the light of earlier work on cold-worked copper by Doppler broadening and other techniques. © 1992 Taylor & Francis Group, LLC.
P. G. Coleman et al., "A Study Of The Recrystallization Of Cold-worked Copper By Doppler Broadening Of Annihilation Radiation," Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties, vol. 66, no. 2, pp. 229 - 235, Taylor and Francis Group; Taylor and Francis, Jan 1992.
The definitive version is available at https://doi.org/10.1080/01418619208201553
Materials Science and Engineering
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01 Jan 1992