Vanadium Doped Nanostructured TiO₂ Dielectrics

Abstract

Dielectric properties of titanium oxide ceramics are strongly influenced by the microstructural features and concentration of dopants and impurity ions. Electrical conductivity (via insulation resistance) of vanadium doped nanostructured titanium dioxide (TiO2) ceramics was measured as a function of donor concentration and temperature. In order to further clarify the effect of the dopants on the microstructural development and resultant dielectric properties of TiO2, electron paramagnetic resonance (EPR) spectroscopy was employed. Vanadium-doped TiO2 exhibited well-defined hyperfine splitting characteristics of the 51V nuclei indicating that the dopant ions are dispersed within the grains and not preferentially segregated at the grain boundaries.

Meeting Name

Materials Research Society (MRS) Symposium Fall Meeting (2013: Dec. 1-6, Boston, MA)

Department(s)

Materials Science and Engineering

Keywords and Phrases

ceramic; dielectric properties; nanostructure; Ceramic materials; Electron spin resonance spectroscopy; Grain boundaries; Magnetic resonance; Microstructural evolution

International Standard Serial Number (ISSN)

0272-9172

Document Type

Article - Conference proceedings

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2014 Materials Research Society (MRS), All rights reserved.

Publication Date

01 Jan 2014

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