Abstract
The ac conductivity of CaCu₃Ti₄O₁₂ ceramics associated with electrical charge carrier motion (ions or vacancies) was investigated as a function of frequency at different temperatures. The long range migration of charge carriers within the ceramic is restricted by two kinds of insulating barriers, namely, grain boundaries and domain boundaries. The potential barriers associated with these boundaries lead to two anomalies in conductivity response and three frequency-dependent contributions to conductivity: long range diffusion of carriers, carrier migration localized within grains, and carrier migration localized within domains.
Recommended Citation
W. Li and R. W. Schwartz, "AC Conductivity Relaxation Processes in CaCu₃Ti₄O₁₂ Ceramics: Grain Boundary and Domain Boundary Effects," Applied Physics Letters, American Institute of Physics (AIP), Dec 2006.
The definitive version is available at https://doi.org/10.1063/1.2405382
Department(s)
Materials Science and Engineering
Sponsor(s)
United States. Office of Naval Research
Keywords and Phrases
Calcium compounds; Domains; Electrical conductivity; Vacancies (crystal); Ceramics; Copper compounds; Dielectric relaxation; Grain boundaries
International Standard Serial Number (ISSN)
0003-6951
Document Type
Article - Journal
Document Version
Final Version
File Type
text
Language(s)
English
Rights
© 2006 American Institute of Physics (AIP), All rights reserved.
Publication Date
01 Dec 2006
