Total ionizing dose (TID) and single event effects testing was performed on Altera Cyclone FPGAs. The devices exhibit slight performance degradation to a TID of 1 Mrad (Si), but also exhibited single event latchup at a low LET.
S. L. Clark et al., "TID and SEE Testing Results of Altera Cyclone Field Programmable Gate Array," Radiation Effects Data Workshop, 2004 IEEE, Institute of Electrical and Electronics Engineers (IEEE), Jan 2004.
The definitive version is available at https://doi.org/10.1109/REDW.2004.1352911
Mathematics and Statistics
Keywords and Phrases
1 Mrad; FPGA; SEE Testing; SEL; SEU; TID; Field Programmable Gate Arrays; Integrated Circuit Reliability; Integrated Circuit Testing; Low LET Single Event Latchup; Performance Degradation; Radiation Effects; Single Event Effects; Total Ionizing Dose
Article - Conference proceedings
© 2004 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
01 Jan 2004