"Improvement of the testability of bit serial array processors using Mu" by Vinod George John

Masters Theses

Title

Improvement of the testability of bit serial array processors using Multiple Input Signature Registers

Author

Vinod George John

Department(s)

Electrical and Computer Engineering

Degree Name

M.S. in Electrical Engineering

Publisher

University of Missouri--Rolla

Publication Date

Spring 1991

Pagination

viii, 84 pages

Rights

Document Type

Thesis - Citation

File Type

text

Language

English

Thesis Number

T 6211

Print OCLC #

24931758

Link to Catalog Record

Full-text not available: Request this publication directly from Missouri S&T Library or contact your local library.

http://merlin.lib.umsystem.edu/record=b2348356~S5

Recommended Citation

John, Vinod George, "Improvement of the testability of bit serial array processors using Multiple Input Signature Registers" (1991). Masters Theses. 990.
https://scholarsmine.mst.edu/masters_theses/990

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