Improvement of the testability of bit serial array processors using Multiple Input Signature Registers
Electrical and Computer Engineering
M.S. in Electrical Engineering
University of Missouri--Rolla
viii, 84 pages
© 1991 Vinod George John, All rights reserved.
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Full-text not available: Request this publication directly from Missouri S&T Library or contact your local library.http://merlin.lib.umsystem.edu/record=b2348356~S5
John, Vinod George, "Improvement of the testability of bit serial array processors using Multiple Input Signature Registers" (1991). Masters Theses. 990.
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