“Transient voltage suppressors (TVS) are used to protect ICs (integrated circuits) against overvoltage, ESD (Electrostatic Discharge), inductive load switching, and even lightning strikes. In this research, a transient behavior model framework for ESD protection devices is used for modelling four different types of TVS (non-snapback, snapback, spark gap like device and varistor). The System-Efficient ESD Design (SEED) methodology is utilized to strengthen the trust in the model framework by efficient simulation of ESD interaction of the off-chip ESD protection devices with the IC ESD protection device and associated measurement data.
Improvements in the TVS transient response, accounting for conductivity modulation, voltage overshot at the snapback voltage, etc., are required to accurately model the ESD protection device. With this in mind, the unimproved model is presented for various ESD protection device where their transient behavior of single component can be fully described by a quasistatic very fast transmission line pulse (VF)-TLP. The improved model is validated within a sub-system consisting of an off-chip ESD protection device, an IC on-chip protection and a PCB trace in between. Multiple solutions to avoid convergence issues are also proposed for effective simulation”--Abstract, page iv.
Beetner, Daryl G.
Electrical and Computer Engineering
M.S. in Electrical Engineering
Missouri University of Science and Technology
Journal article titles appearing in thesis/dissertation
- TVS devices transient behavior modeling framework and application to SEED
- Improved modeling of transient voltage suppression devices
xii, 54 pages
© 2022 Li Shen, All rights reserved.
Thesis - Open Access
Shen, Li, "Optimization and modeling of ESD protection devices" (2022). Masters Theses. 8097.