Masters Theses


”Failures caused by electrostatic discharge (ESD) compromise the reliability of embedded systems. Peripherals such as the universal serial bus (USB) are particularly vulnerable, as isolating them to avoid electromagnetic interference would defy their purpose - facilitating communication with and/or by the embedded system. Better understanding the propagation of failures that result from ESD can facilitate defensive development of hardware and software for embedded systems, but is hampered by the lack of non-invasive and lightweight instrumentation techniques.

The original contribution of this thesis is the design and development of software-based instrumentation for monitoring the reaction of the USB peripheral of an embedded system to ESD. This thesis describes efforts towards detection and root cause analysis of ESD-induced failures - correlating changes in the operation of the peripheral with the specific pin subjected to ESD. The work described is intended as proof-of-concept for the development and use of (in situ) software instrumentation for lightweight acquisition of data that can be used for runtime failure analysis and actuation of self-healing mechanisms, as well as assessment, modeling, and prediction of system reliability, availability, and survivability”--Abstract, page iii.


Sedigh, Sahra

Committee Member(s)

Choi, Minsu
Pommerenke, David


Electrical and Computer Engineering

Degree Name

M.S. in Computer Engineering


The format has been revised for the document downloaded by the button above: landscape-oriented tables, graphs and/or illustrations have been rotated to allow easier online reading. The supplemental file below is the original report format, for printing.


Missouri University of Science and Technology

Publication Date

Spring 2014


viii, 46 pages

Note about bibliography

Includes bibliographic references (pages 43-45).


© 2014 Antonio James Sabatini , All rights reserved.

Document Type

Thesis - Open Access

File Type




Thesis Number

T 12047

Electronic OCLC #