Masters Theses


Yang Xu

Keywords and Phrases

Electromagnetic Compatibility (EMC); Electrostatic discharge (ESD); System-efficient ESD design (SEED); System-level ESD; Transient voltage suppressor (TVS); USB cable


“An IC protected by a transient voltage suppression (TVS) diode may fail if the TVS device does not turn on or does not turn on quickly enough, causing the IC to take the full brunt of the electrostatic discharge (ESD) event. Transient simulation models have been developed for ESD protection devices for the purpose of system-efficient ESD design (SEED). The TVS modeling methodology has been improved to better represent the physics that occurs during the TVS response and more accurately predict the interactions between off-chip and on-chip protection devices. Moreover, a complicated test scenario -- an ESD gun discharge through a USB cable -- was investigated and simulated, to demonstrate the impact of position, grounding condition, and quality of the USB cable. Test and design guidelines are proposed for incorporating a USB cable in a contact-discharge ESD test.

At the beginning, a hybrid simulation approach was proposed, which uses a full-wave model of the ESD gun, cable, and enclosure combined with the ESD protection devices and test board’s circuit-level models. The voltage and current of ESD protection devices are captured within 24-35% compared to the measurements, under various cable configurations.

To further improve the simulation accuracy, physics-based modeling methodologies were proposed to improve the previously developed TVS model, especially on the falling edge after the overshoot. The ESD protection device’s response was studied in simulation and measurement for various cable configurations. And the overall discrepancy is within 30%. The modeling process can help engineers to evaluate the design effectiveness under various complicated test scenarios”--Abstract, page iv.


Beetner, Daryl G.

Committee Member(s)

Khilkevich, Victor
Kim, DongHyun (Bill)


Electrical and Computer Engineering

Degree Name

M.S. in Electrical Engineering


The work is supported partially by the National Science Foundation under Grant No. IIP-1916535.


Missouri University of Science and Technology

Publication Date

Fall 2021

Journal article titles appearing in thesis/dissertation

  • SEED Modeling of an ESD Gun Discharge to a USB Cable Surrogate
  • Transient Modeling of an ESD Gun Discharge Event Through a USB Cable


ix, 52 pages

Note about bibliography

Includes bibliographic references.


© 2021 Yang Xu, All rights reserved.

Document Type

Thesis - Open Access

File Type




Thesis Number

T 11967