Keywords and Phrases
"Integrating a force feedback haptic device with atomic force microscopy (AFM) improves the capability to investigate and manipulate the objects on a micro- and nanoscale surface. The haptic device provides the researcher with a sense of touch and movement by changing the position of the stylus or amount of force on it. The developed system's concept is to provide the user a sense and feel and control of the AFM probe at the nanoscale. By positing the haptic stylus, the user generates reference to commands to the AFM probe. In turn, forces experienced by the probe are communicated to the haptic and transferred to the user. In order to ensure that the forces that act on the haptic and the probe are accurate, it is important to calibrate the normal and lateral forces that act on the tip of the probe. These forces are generated due to using a contact mode interaction between the probe tip and the sample surface. The haptic-probe coupled motion is tested to reach the desired results. Also, a low pass filter is used to remove the undesirable high frequency content from the input force to the haptic since it affects the interaction between the probe"s tip and the sample"s surface. To close, the sensitivities of haptic to the probe position, and displacement of the probe to the force on the haptic are discussed"--Abstract, page iii.
Bristow, Douglas A.
Landers, Robert G.
Balakrishnan, S. N.
Mechanical and Aerospace Engineering
M.S. in Mechanical Engineering
Missouri University of Science and Technology
x, 73 pages
© 2015 Abdulmohsen Alabdulmuhsin, All rights reserved.
Thesis - Open Access
Electronic OCLC #
Alabdulmuhsin, Abdulmohsen, "A force feedback haptic interface for atomic force microscopy" (2015). Masters Theses. 7732.