Masters Theses
Characterization of near field probes and IC transient current prediction and PDN noise estimation
Abstract
"In near-field it is important to find the affected net or IC. Selecting the right loop probe when scanning circuit boards for magnetic field susceptibility is a trade-off between the sensitivity and the spatial resolution. In this paper, multi-turn loop inductor was applied as near-field probe, which can partially overcome. The multi-turn inductors are commercially available in small sizes and large inductance. The limitations of the SMT inductors probe were also investigated"--Abstract, page iii.
Advisor(s)
Pommerenke, David
Committee Member(s)
Beetner, Daryl G.
Drewniak, James L.
Department(s)
Electrical and Computer Engineering
Degree Name
M.S. in Electrical Engineering
Publisher
Missouri University of Science and Technology
Publication Date
Summer 2008
Pagination
x, 79 pages
Note about bibliography
Includes bibliographical references.
Rights
© 2008 Tun Li, All rights reserved.
Document Type
Thesis - Citation
File Type
text
Language
English
Subject Headings
Electronic circuits -- Noise
Loop spaces
Magnetic susceptibility
Printed circuits -- Design and construction
Thesis Number
T 9410
Print OCLC #
298134594
Link to Catalog Record
Full-text not available: Request this publication directly from Missouri S&T Library or contact your local library.
http://merlin.lib.umsystem.edu/record=b6595956~S5Recommended Citation
Li, Tun, "Characterization of near field probes and IC transient current prediction and PDN noise estimation" (2008). Masters Theses. 63.
https://scholarsmine.mst.edu/masters_theses/63
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