Characterization of near field probes and IC transient current prediction and PDN noise estimation

Author

Tun Li

Abstract

"In near-field it is important to find the affected net or IC. Selecting the right loop probe when scanning circuit boards for magnetic field susceptibility is a trade-off between the sensitivity and the spatial resolution. In this paper, multi-turn loop inductor was applied as near-field probe, which can partially overcome. The multi-turn inductors are commercially available in small sizes and large inductance. The limitations of the SMT inductors probe were also investigated"--Abstract, page iii.

Advisor(s)

Pommerenke, David

Committee Member(s)

Beetner, Daryl G.
Drewniak, James L.

Department(s)

Electrical and Computer Engineering

Degree Name

M.S. in Electrical Engineering

Publisher

Missouri University of Science and Technology

Publication Date

Summer 2008

Pagination

x, 79 pages

Note about bibliography

Includes bibliographical references.

Rights

© 2008 Tun Li, All rights reserved.

Document Type

Thesis - Citation

File Type

text

Language

English

Subject Headings

Electronic circuits -- Noise
Loop spaces
Magnetic susceptibility
Printed circuits -- Design and construction

Thesis Number

T 9410

Print OCLC #

298134594

Link to Catalog Record

Full-text not available: Request this publication directly from Missouri S&T Library or contact your local library.

Recommended Citation

Li, Tun, "Characterization of near field probes and IC transient current prediction and PDN noise estimation" (2008). Masters Theses. 63.
https://scholarsmine.mst.edu/masters_theses/63