Characterization of near field probes and IC transient current prediction and PDN noise estimation
"In near-field it is important to find the affected net or IC. Selecting the right loop probe when scanning circuit boards for magnetic field susceptibility is a trade-off between the sensitivity and the spatial resolution. In this paper, multi-turn loop inductor was applied as near-field probe, which can partially overcome. The multi-turn inductors are commercially available in small sizes and large inductance. The limitations of the SMT inductors probe were also investigated"--Abstract, page iii.
Beetner, Daryl G.
Drewniak, James L.
Electrical and Computer Engineering
M.S. in Electrical Engineering
Missouri University of Science and Technology
x, 79 pages
© 2008 Tun Li, All rights reserved.
Thesis - Citation
Electronic circuits -- Noise
Printed circuits -- Design and construction
Print OCLC #
Link to Catalog Record
Full-text not available: Request this publication directly from Missouri S&T Library or contact your local library.http://merlin.lib.umsystem.edu/record=b6595956~S5
Li, Tun, "Characterization of near field probes and IC transient current prediction and PDN noise estimation" (2008). Masters Theses. 63.
Share My Thesis If you are the author of this work and would like to grant permission to make it openly accessible to all, please click the button above.