"A computer controlled apparatus for the measurement of dc electrical conductivity and Seebeck coefficient as a function of temperature and oxygen partial pressure has been developed. Thermocouples are in electrical and thermal contact with the ends of the specimen bar. This allows both Seebeck and four-wire electrical conductivity measurements to be made in situ. Environmental enclosure of the specimen allows measurements over a range of oxygen activities from 1 to 10-18 atm. A discussion of the measuring technique with schematics of the apparatus and data retrieval system is made. Results for measurements in selected oxide ceramics are compared to literature cited values. The 3ε uncertainty in the Seebeck coefficient is found to be 6.2% or less. The uncertainty in the electrical conductivity, σ , is found to be 2% or less"--Abstract, page ii.
Anderson, H. U. (Harlan U.)
Sparlin, Don M.
Materials Science and Engineering
M.S. in Ceramic Engineering
United States. Department of Energy
University of Missouri--Rolla
viii, 64 pages
© 1987 George Francis Carini, II, All rights reserved.
Thesis - Restricted Access
Library of Congress Subject Headings
Thermoelectric apparatus and appliances
Electric conductivity -- Measurement
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Electronic access to the full-text of this document is restricted to Missouri S&T users. Otherwise, request this publication directly from Missouri S&T Library or contact your local library.http://laurel.lso.missouri.edu/record=b2106173~S5
Carini, George Francis II, "An apparatus for the measurement of dc electrical conductivity and Seebeck coefficient of semiconductors as a function of high temperature and oxygen partial pressure" (1987). Masters Theses. 621.
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