Investigations of thermal annealing effect on interface states of SOS devices using DLTS method
Electrical and Computer Engineering
M.S. in Electrical Engineering
University of Missouri--Rolla
vi, 61 pages
© 1988 Dar-Sen Horng, All rights reserved.
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Full-text not available: Request this publication directly from Missouri S&T Library or contact your local library.http://laurel.lso.missouri.edu/record=b2025265~S5
Horng, Dar-Sen, "Investigations of thermal annealing effect on interface states of SOS devices using DLTS method" (1988). Masters Theses. 563.
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