"In the first section, a concept for analyzing ESD generators and coupling to EUT (equipment under test) in the frequency domain is presented. Its novelty lies, not only in accounting for the current shaping, but also in accounting for the radiation effects of structural elements and electrical components located within the ESD generator without discharging it. This is accomplished in the frequency domain by substituting the electrical breakdown within the ESD generator (contact mode) for one port of a network analyzer. The network analyzer excites all the pulse forming and the radiating elements of the ESD generator as during a discharge. This offers the advantage of an increased dynamic range of frequency domain techniques without having to simplify the complex radiation properties of real ESD simulators.
In the second section, an advanced full wave ESD generator model for system level coupling simulation is presented. System level ESD tests can only be performed after hardware is available. Simulating the ESD coupling into a circuit allows at least parametric and quantitative studies of the expected ESD behavior. A complete simulation requires modeling the ESD generator, the passive elements of the DUT and the response of the ICs to injected noise. Having the ultimate objective of combining IC soft error response models with the DUT structure and the ESD generator, progresses in modeling the ESD generator and its coupling are reported. The model improves the useful frequency range from a few hundred MHz to about 3 GHz"--Abstract, page iii.
Drewniak, James L.
Beetner, Daryl G.
Electrical and Computer Engineering
M.S. in Electrical Engineering
Electromagnetic Compatibility (EMC) Laboratory
Missouri University of Science and Technology
Journal article titles appearing in thesis/dissertation
- Frequency domain measurement method for the analysis of ESD generators and coupling
- Advanced full wave ESD generator model for system level coupling simulation
ix, 66 pages
© 2008 Qing Cai, All rights reserved.
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Electronic access to the full-text of this document is restricted to Missouri S&T users. Otherwise, request this publication directly from Missouri S&T Library or contact your local library.http://merlin.lib.umsystem.edu/record=b6491547~S5
Cai, Qing, "Experiment and numerical analysis of system level ESD coupling" (2008). Masters Theses. 52.
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