Masters Theses

Abstract

"This document describes the assembly and use of a Hall measurement system that has the capability to automatically determine the resistivity, the Hall coefficient, and the Hall mobility of a semiconductor sample. This experiment can be performed at room temperature or over a range of temperatures. The applicable temperature range that this system can operate in depends only on the method used to cool the sample. All the examples described herein used liquid nitrogen to cool the sample to 77 Kelvin. Note, however, that this system was not intended to take measurements at temperatures higher than room temperature. The sample can be of any arbitrary shape and can be made of any conducting or partially conducting material. The sample must simply be small enough to physically fit on the sample holder. Sample sizes of 1 cm square were used in this experiment"--Abstract, page iii.

Advisor(s)

Boone, Jack L.

Committee Member(s)

Erickson, Kelvin T.
Waddill, George Daniel

Department(s)

Electrical and Computer Engineering

Degree Name

M.S. in Electrical Engineering

Sponsor(s)

National Science Foundation (U.S.)

Comments

This project was funded through the National Science Foundation, grant number DMR 9633107.

Publisher

University of Missouri--Rolla

Publication Date

Spring 2000

Pagination

ix, 51 pages

Note about bibliography

Includes bibliographical references (page 50).

Rights

© 2000 Andrew Todd Bauer, All rights reserved.

Document Type

Thesis - Restricted Access

File Type

text

Language

English

Thesis Number

T 7742

Print OCLC #

44644862

Electronic OCLC #

1105810650

Link to Catalog Record

Electronic access to the full-text of this document is restricted to Missouri S&T users. Otherwise, request this publication directly from Missouri S&T Library or contact your local library.

http://merlin.lib.umsystem.edu/record=b4443450~S5

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