"This document describes the assembly and use of a Hall measurement system that has the capability to automatically determine the resistivity, the Hall coefficient, and the Hall mobility of a semiconductor sample. This experiment can be performed at room temperature or over a range of temperatures. The applicable temperature range that this system can operate in depends only on the method used to cool the sample. All the examples described herein used liquid nitrogen to cool the sample to 77 Kelvin. Note, however, that this system was not intended to take measurements at temperatures higher than room temperature. The sample can be of any arbitrary shape and can be made of any conducting or partially conducting material. The sample must simply be small enough to physically fit on the sample holder. Sample sizes of 1 cm square were used in this experiment"--Abstract, page iii.
Boone, Jack L.
Erickson, Kelvin T.
Waddill, George Daniel
Electrical and Computer Engineering
M.S. in Electrical Engineering
National Science Foundation (U.S.)
University of Missouri--Rolla
ix, 51 pages
© 2000 Andrew Todd Bauer, All rights reserved.
Thesis - Restricted Access
Print OCLC #
Electronic OCLC #
Link to Catalog Record
Electronic access to the full-text of this document is restricted to Missouri S&T users. Otherwise, request this publication directly from Missouri S&T Library or contact your local library.http://laurel.lso.missouri.edu/record=b4443450~S5
Bauer, Andrew Todd, "Automated temperature dependent Hall measurement system" (2000). Masters Theses. 1924.
Share My Thesis If you are the author of this work and would like to grant permission to make it openly accessible to all, please click the button above.