An X-ray diffraction study of an attempt to cause amorphization in Co-Si multilayers by nickel diffusion
Materials Science and Engineering
M.S. in Metallurgical Engineering
University of Missouri--Rolla
ix, 59 pages
© 1993 Chien-tsai Lin, All rights reserved.
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Full-text not available: Request this publication directly from Missouri S&T Library or contact your local library.http://merlin.lib.umsystem.edu/record=b1613744~S5
Lin, Chien-Tsai, "An X-ray diffraction study of an attempt to cause amorphization in Co-Si multilayers by nickel diffusion" (1993). Masters Theses. 1175.
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