Performance Prediction of a Vanadium Redox Battery for use in Portable, Scalable Microgrids
Vanadium redox batteries (VRBs) have proven to be a viable energy storage technology for portable microgrids due to their rechargeability and high energy density. VRBs exhibit parasitic load loss during operation due to pumping of electrolyte across the membrane during charging and discharging cycles, as well as required temperature control in the form of heating, ventilation and air conditioning. This paper focuses on empirically characterizing VRB efficiency based on known climatic operating conditions and load requirements. A model is created to determine system performance based on known climatic and load data collected and analyzed over an extended time period. A case study is performed using known data for a week time period to characterize system performance, which was compared to actual system performance observed during this same time period. This model allows for appropriate sizing of the PV array and discretionary loads based on required energy density of the system.
J. D. Guggenberger et al., "Performance Prediction of a Vanadium Redox Battery for use in Portable, Scalable Microgrids," IEEE Transactions on Smart Grid, vol. 3, no. 4, pp. 2109-2116, Institute of Electrical and Electronics Engineers (IEEE), Dec 2012.
The definitive version is available at https://doi.org/10.1109/TSG.2012.2215891
Geosciences and Geological and Petroleum Engineering
Electrical and Computer Engineering
Keywords and Phrases
Batteries; energy management; energy storage; load management; load modeling; performance evaluation; predictive modeling; statistical analysis; Actual system; Energy density; High energy densities; Load data; Micro grid; Operating condition; Parasitic loads; Performance based; Performance evaluation; Performance prediction; PV arrays; Rechargeability; Storage technology; Time-periods; Vanadium redox batteries
International Standard Serial Number (ISSN)
Article - Journal
© 2012 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
01 Dec 2012