An Experimental Investigation of Higher Order Mode Suppression in TEM Cells

Shaowei Deng
David Pommerenke, Missouri University of Science and Technology
Todd H. Hubing, Missouri University of Science and Technology
Dongshik Shin

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Transverse electromagnetic (TEM) cells can be used to evaluate the electric and magnetic fields coupling from integrated circuits (ICs). The propagation and reflection of higher order modes in the cells limits the bandwidth of TEM cells. This paper investigates several methods for suppressing higher order modes in TEM cells in order to extend the applicable frequency range without changing the test topology. Numerical models and measurements of a modified TEM cell demonstrate how higher order mode suppression techniques can extend the useful frequency range of a TEM cell for IC measurements from 1 to 2.5 GHz.