Electrical Material Property Measurements using a Free-Field, Ultra-Wideband System [Dielectric Measurements]

R. Johnk
D. Novotny
S. Canales
J. Baker-Jarvis
M. Janezic
James L. Drewniak, Missouri University of Science and Technology
Marina Koledintseva, Missouri University of Science and Technology
J. Zhang
P. Rawa
C. A. Grosvenor

This document has been relocated to http://scholarsmine.mst.edu/ele_comeng_facwork/1577

There were 7 downloads as of 28 Jun 2016.


We present nondestructive measurements of material properties using TEM horn antennas and an ultra-wideband measurement system. Time-domain gating and genetic algorithms are used to process the data and extract the dielectric properties of the material under test.