Some faults in storage elements (SEs) do not manifest as stuck-at-0/1 faults. These include data-feedthrough faults that cause the SE cell to exhibit combinational behaviour. The authors investigate the implications of such faults on the behaviour of circuits using unclocked SEs. It is shown that effects of data-feedthrough faults at the behavioural level are different from those due to stuck-at faults, and therefore tests generated for the latter may be inadequate
W. K. Al-Assadi et al., "Data-Feedthrough Faults in Circuits using Unclocked Storage Elements," Electronics Letters, Institute of Electrical and Electronics Engineers (IEEE), Jan 1994.
The definitive version is available at https://doi.org/10.1049/el:19940514
Electrical and Computer Engineering
Keywords and Phrases
CMOS Integrated Circuits; Asynchronous Sequential Logic; Behavioural Level; Circuit Faults; Combinational Behaviour; Combinatorial Circuits; Data-Feedthrough Faults; Logic Testing; Semiconductor Storage; Stuck-At Faults; Stuck-At-0/1 Faults; Unclocked Storage Elements
International Standard Serial Number (ISSN)
Article - Journal
© 1994 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.