This article presents a wideband phase less source reconstruction method (SRM) for the evaluation of the radiated emissions from printed circuit boards (PCBs) in shielding enclosures. The PCBs are modeled with equivalent dipoles, and the numerical Green's function (NGF) is deployed to establish the relationship between the equivalent source and the input near-field (NF) data, thus the electromagnetic influences of the surrounding environments comprehensively accounted. This method only requires magnitude-only NF scanning over a single plane, thus significantly decreasing the NF measurement difficulty. To remedy the lack of phase information of the NF data, the input NF data are equally divided into two groups with a uniform distribution strategy, and then the phase of NF data can be retrieved via an iterative approach. Moreover, with the objective of improving the convergence of the iterative SRM procedure, the initial phase of the NF data is set as the same as the NGF. In addition, a cubic-spline-algorithm-enhanced adaptive frequency sampling strategy is applied for source reconstruction in a wide frequency band, which avoids repetitively implementing the SRM at every frequency, thus saving a large amount of CPU time. To validate the effectiveness of the proposed wideband phase less SRM, several representative numerical examples are investigated, in which both the NF and the far-field radiated emission are evaluated.


Electrical and Computer Engineering

Publication Status

Early Access

Keywords and Phrases

Adaptive frequency sampling (AFS); Integrated circuit modeling; Interpolation; Magnetic noise; Magnetic shielding; Noise measurement; numerical Green's function (NGF); phase retrieval; printed circuit boards (PCBs) in shielding enclosure; single-plane phaseless near-field (NF) scanning; Splines (mathematics); Tikhonov regularization; Wideband; wideband phaseless source reconstruction

International Standard Serial Number (ISSN)

1558-187X; 0018-9375

Document Type

Article - Journal

Document Version


File Type





© 2024 Institute of Electrical and Electronics Engineers, All rights reserved.

Publication Date

01 Jan 2024