In many applications, the device under test (DUT) is embedded into a test setup. Various de-embedding techniques have been proposed to expose the real electrical behaviors of a DUT, e.g., the traditional thru-reflect-line and short-open-load-thru algorithms, where the T-matrix and its inverse form are adopted in the mathematical process. In the fields of radiofrequency and electromagnetic compatibility, a DUT may have three coupled ports, and the symmetry in the associated S-matrix breaks down, because the numbers of entry and exist ports are not equal, which results in a non-square T-matrix based upon the definitions. Given that the inverse expression of a non-square matrix does not exist, the conventional de-embedding methods are not applicable for a coupled three-port network. In this paper, a de-embedding algorithm which is feasible for coupled three-port devices is proposed and verified through the measurement-based studies. The de-embedding technique may also be applied on devices with more than three ports.
Y. Guo et al., "De-Embedding for Coupled Three-Port Devices," 2022 Asia-Pacific International Symposium on Electromagnetic Compatibility, APEMC 2022, pp. 742 - 745, Institute of Electrical and Electronics Engineers, Jan 2022.
The definitive version is available at https://doi.org/10.1109/APEMC53576.2022.9888499
Electrical and Computer Engineering
Keywords and Phrases
AC bus bar; coupling; de-embedding; S-parameter; T-matrix; test fixture; three-phase motor
International Standard Book Number (ISBN)
Article - Conference proceedings
© 2023 Institute of Electrical and Electronics Engineers, All rights reserved.
01 Jan 2022
National Science Foundation, Grant IIP-1916535