In many applications, the device under test (DUT) is embedded into a test setup. Various de-embedding techniques have been proposed to expose the real electrical behaviors of a DUT, e.g., the traditional thru-reflect-line and short-open-load-thru algorithms, where the T-matrix and its inverse form are adopted in the mathematical process. In the fields of radiofrequency and electromagnetic compatibility, a DUT may have three coupled ports, and the symmetry in the associated S-matrix breaks down, because the numbers of entry and exist ports are not equal, which results in a non-square T-matrix based upon the definitions. Given that the inverse expression of a non-square matrix does not exist, the conventional de-embedding methods are not applicable for a coupled three-port network. In this paper, a de-embedding algorithm which is feasible for coupled three-port devices is proposed and verified through the measurement-based studies. The de-embedding technique may also be applied on devices with more than three ports.


Electrical and Computer Engineering


National Science Foundation, Grant IIP-1916535

Keywords and Phrases

AC bus bar; coupling; de-embedding; S-parameter; T-matrix; test fixture; three-phase motor

International Standard Book Number (ISBN)


Document Type

Article - Conference proceedings

Document Version

Final Version

File Type





© 2023 Institute of Electrical and Electronics Engineers, All rights reserved.

Publication Date

01 Jan 2022