Abstract
Frequency-dependent electrical properties of dielectric materials are one of the most important factors for high-speed signal integrity design. Recently a method of accurately measuring the dielectric loss tangent ($\tan \delta$) of differential lines was proposed. By taking into account the ratio between the differential and common mode per-unit-length resistances the surface roughness contribution to the total loss is eliminated and dielectric parameters can be determined. In this article a similar method is applied to a combination of two single-ended lines. To evaluate the accuracy of the extraction, the impact of the de-embedding errors was investigated, which allows to optimize the test PCB design. The extraction method was validated in measurement using a PCB with several two-width pairs of strip lines. The extracted loss tangent of several optimal two width pairs of single-ended lines is validated by the SPDR measurements.
Recommended Citation
J. Li et al., "Dielectric Loss Tangent Extraction using Two Single-Ended Striplines of Different Width," 2022 IEEE International Symposium on Electromagnetic Compatibility and Signal/Power Integrity, EMCSI 2022, pp. 86 - 91, Institute of Electrical and Electronics Engineers, Jan 2022.
The definitive version is available at https://doi.org/10.1109/EMCSI39492.2022.9889568
Department(s)
Electrical and Computer Engineering
Keywords and Phrases
cross-sectional analysis; de-embedding; error analysis; Loss tangent; S-parameters; SPDR; surface roughness
International Standard Book Number (ISBN)
978-166540929-2
Document Type
Article - Conference proceedings
Document Version
Final Version
File Type
text
Language(s)
English
Rights
© 2023 Institute of Electrical and Electronics Engineers, All rights reserved.
Publication Date
01 Jan 2022
Comments
National Science Foundation, Grant IIP-1916535