Abstract
As the data rate and density of digital high-speed systems are getting higher, far-end crosstalk (FEXT) noise becomes one of the major issues that limit signal integrity performance. It was commonly believed that FEXT would be eliminated for strip lines routed in a homogeneous dielectric, but in reality, FEXT can always be measured in strip lines on the fabricated printed circuit boards. A slightly different dielectric permittivity (ϵr) of prepreg and core may be one of the major contributors to the FEXT. This article is focusing on providing a practical FEXT modeling methodology for strip lines by introducing an approach to extract ϵr of prepreg and core. Using the known cross-sectional geometry and measured S-parameters of the coupled strip line, the capacitance components in prepreg and core are separated using a two-dimensional solver, and the ϵr of prepreg and core is determined. A more comprehensive FEXT modeling approach is proposed by applying extracted inhomogeneous dielectric material information.
Recommended Citation
S. Yong and S. Penugonda and D. Kim and V. Khilkevich and B. Pu and X. Ye and Q. Gao and X. D. Cai and B. Sen and J. Fan, "Prepreg and Core Dielectric Permittivity (ϵr) Extraction for Fabricated Striplines' Far-End Crosstalk Modeling," IEEE Transactions on Electromagnetic Compatibility, vol. 64, no. 1, pp. 209 - 218, Institute of Electrical and Electronics Engineers, Feb 2022.
The definitive version is available at https://doi.org/10.1109/TEMC.2021.3083771
Department(s)
Electrical and Computer Engineering
Keywords and Phrases
Dielectric material; Far-end crosstalk (FEXT); Stripline; Transmission-line theory
International Standard Serial Number (ISSN)
1558-187X; 0018-9375
Document Type
Article - Journal
Document Version
Final Version
File Type
text
Language(s)
English
Rights
© 2023 Institute of Electrical and Electronics Engineers, All rights reserved.
Publication Date
01 Feb 2022
Comments
National Science Foundation, Grant IIP-1440110