Active Probes for Creating H-Field Probes for Flat Frequency Response
This paper presents an approach to obtain a flat frequency response from the first order derivative behavior of an electrically small loop and electrically short electric field probe by using them in combination with active oscilloscope probes. An H-field probe made in flex circuit technology was designed to operate up to about 5 GHz. These probes have loop dimensions as small as 3 × 3 mil and trace widths in the order of 1.75 mils. The H-field probe terminals are connected to the differential amplifier of the active oscilloscope probe which functions as an integrator to achieve a flat frequency response. The integrator behavior compensates for the first order derivative response of the flex circuit probes. The E-field probe utilizes the high input impedance of the browser attached to the active probe for achieving a flat frequency response.
S. Mittal et al., "Active Probes for Creating H-Field Probes for Flat Frequency Response," Proceedings of the IEEE International Symposium on Electromagnetic Compatibility (2009, Austin, TX), pp. 12-17, Institute of Electrical and Electronics Engineers (IEEE), Aug 2009.
The definitive version is available at https://doi.org/10.1109/ISEMC.2009.5284635
IEEE International Symposium on Electromagnetic Compatbility (2009: Aug. 17-21, Austin, TX)
Electrical and Computer Engineering
Electromagnetic Compatibility (EMC) Laboratory
Keywords and Phrases
Active Probe; E-Field; First Order Derivatives; Flat Frequency Response; Flex Circuits; High Input Impedance; Cathode Ray Oscilloscopes; Differential Amplifiers; Electric Fields; Electric Impedance; Electromagnetic Compatibility; Integrated Circuits; Oscillographs; Plastic Molds; Probes; Ultrasonic Devices; Frequency Response; Flexible Electronics; Oscilloscopes; Radio Frequency; Coupling Circuits; Connectors; Frequency Conversion; Circuit Testing; Flex Circuit Technology; Active Probes; H-Field Probes; First Order Derivative Behavior; Electrically Short Electric Field Probe; E-Dot Sensor; H-Dot Sensor; Integrator; Derivative
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Article - Conference proceedings
© 2009 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
01 Aug 2009