Title

Analysis of Various Transformer Structures for High Frequency Isolation Applications

Abstract

High frequency transformers are an integral part of power electronics devices and their parasitic parameters influence the performance and efficiency of the overall system. In this paper, transformer leakage inductances and parasitic capacitances are analyzed using finite element method (FEM) for different structures and windings arrangements of high frequency transformers. Also, magnetic field, electric field, and voltage distribution within the transformer is simulated and analyzed. Six different high frequency transformers with toroidal, EE, and UU cores with different windings are investigated for a 400(V)/400(V), 8 kVA transformer operating at 10 kHz. Additionally, interleaved windings for EE core are simulated and results compared with previous outcomes. Analysis results will help categorize each structure, based on its balance between leakage inductances and series parasitic capacitance. This information can later be used for optimal selection of transformers as a function of their operating frequency and enable designers to compromise between various parameters in different applications, especially new fast switches such as SiC and GaN.

Meeting Name

51st North American Power Symposium, NAPS 2019 (2019: Oct. 13-15, Wichita, KS)

Department(s)

Electrical and Computer Engineering

Research Center/Lab(s)

Center for Research in Energy and Environment (CREE)

Comments

This material is based upon work supported by the U.S. Department of Energy, "Enabling Extreme Fast Charging with Energy Storage", DE-EE0008449.

Keywords and Phrases

High Frequency Transformers; Leakage Inductance; Magnetic and Electric Field Distribution; Parasitic Capacitance; Winding Arrangements

International Standard Book Number (ISBN)

978-172810407-2

Document Type

Article - Conference proceedings

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2019 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.

Publication Date

01 Oct 2019

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