Utilizing microwave reflections to compare a reference device with counterfeit and/or aging devices under test. The reflection from the device under test varies based on certain properties, which results in each device having a unique and intrinsic electromagnetic signature. Comparisons of the electromagnetic signature of the device under test to the electromagnetic signature of a reference device enable evaluating the acceptability of the device under test.
M. T. Ghasr et al., "Microwave Reflectometry for Physical Inspections," U.S. Patents, Jul 2019.
Electrical and Computer Engineering
Patent Application Number
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25 Jul 2019