Spatial Mapping of Complex Permittivity from Synthetic Aperture Radar (SAR) Images
In this paper, a novel method to extract complex permittivity from synthetic aperture radar (SAR) images is proposed. The principle of the proposed method is outlined, followed by electromagnetic simulations, which is then verified by measurements. The simulation and measurement results show that the proposed method can accurately extract complex permittivity of a material-under-test (MUT), and generate high-resolution spatial map of this parameter. Measurement results also show that proposed method is capable of quantitatively resolving local inhomogeneity contrast. This makes the proposed approach a potential and good candidate for utilization in nondestructive evaluation (NDE) applications. The limitations of the proposed method are also discussed. Comparing to quantitative microwave and millimeter wave method based on inverse scattering techniques, this proposed method requires much less computational resources.
Y. Gao et al., "Spatial Mapping of Complex Permittivity from Synthetic Aperture Radar (SAR) Images," Proceedings of the 2019 IEEE Instrumentation and Measurement Technology Conference (2019, Auckland, New Zealand), Institute of Electrical and Electronics Engineers (IEEE), May 2019.
The definitive version is available at https://doi.org/10.1109/I2MTC.2019.8827052
2019 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2019 (2019: May 20-23, Auckland, New Zealand)
Electrical and Computer Engineering
Keywords and Phrases
Dielectric Properties; Materials Characterization; Nondestructive Evaluation; Synthetic Aperture Radar
International Standard Book Number (ISBN)
International Standard Serial Number (ISSN)
Article - Conference proceedings
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01 May 2019