Wideband Multi-Loop FSS Absorber Design based on Q- Factor Approach
Absorbing materials are important to many structures and systems in the defense industry. Frequency selective surfaces (FSSs) can be designed to provide a conformal absorptive solution. In this work, a wideband and absorptive FSS is presented that operates over the entire X-band (8.2 to 12.4 GHz). Nickel is utilized for the three-loop conductive elements in order to achieve wideband operation. The design approach utilized here considers the equivalent resonator model, which requires that the radiation quality factor (Qrad) and parallel combination of the conductive and dielectric loss quality factors (Q0) be comparable for absorptive FSS properties. Using this approach, a single loop FSS is first designed that, when used as a basis for the wideband three-element design, provides the necessary condition of Qrad = Q0. The wideband operation is ultimately achieved through proper selection of the individual loop dimensions and relative spacing.
M. Mahmoodi and K. M. Donnell, "Wideband Multi-Loop FSS Absorber Design based on Q- Factor Approach," Proceedings of the 2018 IEEE Antennas and Propagation Society International Symposium and USNC/URSI National Radio Science Meeting (2018, Boston, MA), pp. 2061-2062, Institute of Electrical and Electronics Engineers (IEEE), Jul 2018.
The definitive version is available at https://doi.org/10.1109/APUSNCURSINRSM.2018.8608318
2018 IEEE Antennas and Propagation Society International Symposium and USNC/URSI National Radio Science Meeting, APSURSI 2018 (2018: Jul. 8-13, Boston, MA)
Electrical and Computer Engineering
Keywords and Phrases
Dielectric losses; Electromagnetic wave absorption; Electromagnetic wave polarization; Frequency selective surfaces; Absorber; Absorbing materials; Conductive elements; Frequency selective surface (FSSs); Parallel combination; Q-factors; Radiation quality factor; Wide-band; Q factor measurement; Wideband
International Standard Book Number (ISBN)
International Standard Serial Number (ISSN)
Article - Conference proceedings
© 2018 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
01 Jul 2018