Title

RFI Noise Source Quantification based on Reciprocity

Abstract

In modern mobile electronic systems, several high speed digital ICs often working simultaneously and can cause interference issues with nearby antennas at the same time. In this paper, a method to quantify the contribution of multiple noise sources radiating simultaneously is proposed. The reciprocity theorem based radio frequency interference (RFI) estimation can be decomposed into forward and reverse problems. Multiple imaginary Huygens' boxes are introduced to enclose different IC noise sources. In forward problem, the ICs are working and the tangential E and H fields on corresponding Huygens' boxes can be obtained. In reverse problem, the victim antenna is excited while the noise sources are turned off. On the same set of Huygens' boxes, the tangential electromagnetic fields from the radiating antenna can also be recorded. With tangential E and H fields in both the forward and reverse problems on different Huygens' boxes, the coupled voltage contributed by multiple noise sources can be calculated separately using reciprocity theorem. The RFI noise source quantification method is validated by simulation. A test structure with two simultaneously radiated traces and a planar inverted-F antenna (PIFA) is used.

Meeting Name

2018 IEEE Symposium on Electromagnetic Compatibility, Signal Integrity and Power Integrity, EMC, SI and PI 2018 (2018: Jul. 30-Aug. 3, Long Beach, CA)

Department(s)

Electrical and Computer Engineering

Comments

This work was supported by ASUSTek Computer Inc. and the National Science Foundation (NSF) under Grants No. IIP-1440110.

Keywords and Phrases

Busbars; Decomposition; Digital integrated circuits; Electromagnetic compatibility; Electromagnetic fields; Frequency estimation; Microstrip antennas; Partial discharges; Radio waves; Mobile electronics; Multiple noise sources; Near-field scanning; Noise source; Planar inverted-F antenna; Radiating antennas; Radio frequency interference; Reciprocity theorem; Radio interference; Near field scanning; Noise source quantification

International Standard Book Number (ISBN)

978-1-5386-6621-0

Document Type

Article - Conference proceedings

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2018 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.

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