An Efficient Approach to Find the Truncation Frequency for Transmission Line-Based Dielectric Material Property Extraction
Material properties of dielectric substrates play an important role in high-speed printed circuit board (PCB) design. The Transmission Line-Based material property extraction method is an effective way to obtain substrate properties. However, the method requires transmission line dominated S-parameter data. Even with de-embedding, S-parameters may include non-transmission line effects. Thus, to obtain correct material properties, it is necessary to truncate the S-parameter data at a frequency before non-transmission line effects begin to dominate. In this paper, a novel binary fitting-based method is proposed to find the truncation frequency accurately and efficiently. By using a binary search algorithm and physics-based fitting method, the proposed method is able to find the truncation frequency in only a few iterations. This method has been validated for hundreds of real measurement cases and has shown good adaptability and rationality.
X. Sun et al., "An Efficient Approach to Find the Truncation Frequency for Transmission Line-Based Dielectric Material Property Extraction," Proceedings of the 2018 IEEE Symposium on Electromagnetic Compatibility, Signal Integrity and Power Integrity (2018, Long Beach, CA), pp. 588 - 593, Institute of Electrical and Electronics Engineers (IEEE), Jul 2018.
The definitive version is available at https://doi.org/10.1109/EMCSI.2018.8495409
2018 IEEE Symposium on Electromagnetic Compatibility, Signal Integrity and Power Integrity, EMC, SI and PI 2018 (2018: Jul. 30-Aug. 3, Long Beach, CA)
Electrical and Computer Engineering
Keywords and Phrases
Busbars; Dielectric materials; Electric lines; Electromagnetic compatibility; Printed circuit boards; Printed circuit design; Scattering parameters; Substrates; 'Root-Omega' method; Binary fitting; Binary search algorithm; Dielectric substrates; Printed circuit board designs; Property extractions; Substrate properties; Truncation frequency; Extraction; Material property extraction; Transmission-line based
International Standard Book Number (ISBN)
Article - Conference proceedings
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01 Jul 2018