Modeling and Measurement of Ground Bounce Induced by High-Speed Output Buffer with On-Chip Low-Dropout (LDO) Regulator
This study proposes a model of ground bounce induced by a high-speed output buffer with on-chip low-dropout (LDO) regulator. When the output buffer operates with a high-speed clock, high output impedance of the pass transistor and low impedance of the on-chip decoupling capacitor at load enable the ground bounce calculation by only using the self-impedance of the off-chip ground network and switching current spectra. The accuracy of the proposed model is indirectly validated by measurement. Simulated ground bounce by using the proposed model shows very good correlation with the experimentally validated SPICE model.
H. Kim et al., "Modeling and Measurement of Ground Bounce Induced by High-Speed Output Buffer with On-Chip Low-Dropout (LDO) Regulator," IEEE Transactions on Electromagnetic Compatibility, vol. 60, no. 4, pp. 1022-1025, Institute of Electrical and Electronics Engineers (IEEE), Aug 2018.
The definitive version is available at https://doi.org/10.1109/TEMC.2017.2759123
Electrical and Computer Engineering
Electromagnetic Compatibility (EMC) Laboratory
National Science Foundation (U.S.)
Keywords and Phrases
Electric current regulators; Good correlations; Ground bounce; Low-dropout regulators; Modeling and measurement; On-chip Decoupling capacitors; Output Buffer; Pass transistors; Switching currents; SPICE; High-speed output buffer; On-chip low-dropout (LDO) regulator
International Standard Serial Number (ISSN)
Article - Journal
© 2018 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
01 Aug 2018