Advanced On-Chip SOL Calibration Method for Unknown Fixture De-embedding
Abstract
SOL (Short, Open and Load) calibration based on iterative error sensitivity is proposed in this paper. With advanced SOL calibration, unknown parasitic parameters at on-chip terminations are accurately estimated up to 20 GHz. Artificial terminations are designed on printed circuit board (PCB) to experiment the proposed method. On-chip SHORT, OPEN and LOAD fabricated inside silicon shows the accuracy of proposed calibration method through the comparison with known fixture S-parameter after de-embedding.
Recommended Citation
C. Yoon et al., "Advanced On-Chip SOL Calibration Method for Unknown Fixture De-embedding," Journal of Semiconductor Technology and Science, vol. 17, no. 4, pp. 543 - 551, Institute of Electronics Engineers of Korea, Aug 2017.
The definitive version is available at https://doi.org/10.5573/JSTS.2017.17.4.543
Department(s)
Electrical and Computer Engineering
Keywords and Phrases
Fixtures (tooling); Iterative methods; Printed circuit boards; Scattering parameters; Sols; Calibration method; De-embedding; Iterative error; On chips; Parasitic parameter; Printed circuit boards (PCB); Calibration; Iterative error sensitivity; SOL calibration
International Standard Serial Number (ISSN)
1598-1657; 2233-4866
Document Type
Article - Journal
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2017 Institute of Electronics Engineers of Korea, All rights reserved.
Publication Date
01 Aug 2017
