Generation Capacity Extension in the Power System with Large-Scale PHEV Integration
The Electric Power Research Institute (EPRI) predicts approximately a 60% penetration level of PHEV fleets throughout the U.S. by 2050. Increasing the number of PHEVs jeopardizes the reliable operation of the power system. Random, excessive power demands from PHEVs can put noticeable stress on the bulk power system, which accordingly causes congestions, overloads and cascaded outages. This paper proposes an approach that assesses how much generation expansion is required to maintain the reliability of the power system in the presence of PHEVs. To evaluate the impact of PHEVs on the reliability of the system, a time-based simulation has been performed. In addition, based on vehicle data and the domestic load profile in the North West Power Pool area (NWPP), reliability indices have been calculated. The results show that the existing power system infrastructure is not robust enough for higher penetration levels.
B. Falahati et al., "Generation Capacity Extension in the Power System with Large-Scale PHEV Integration," Proceedings of the IEEE Power Engineering Society Transmission and Distribution Conference (2012, Orlando, FL), Institute of Electrical and Electronics Engineers (IEEE), May 2012.
The definitive version is available at https://doi.org/10.1109/TDC.2012.6281672
IEEE Power Engineering Society Transmission and Distribution Conference (2012: May 7-10, Orlando, FL)
Electrical and Computer Engineering
Keywords and Phrases
Bulk Power Systems; Electric Power Research Institute; Generation Capacity; Generation Expansion; Load Profiles; Penetration Level; Plugin Hybrid Electric Vehicles (PHEV); Power Demands; Power Pools; Power System Reliability; Reliability Index; Reliable Operation; Electric Power Systems; Exhibitions; Outages; Plug-In Hybrid Electric Vehicle; Reliability; Vehicles; Load Modeling; Batteries; Plugs; Power Generation Reliability; Hybrid Electric Vehicles; Load (Electric)
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Article - Conference proceedings
© 2012 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
01 May 2012