Quantifying EMI: A Methodology for Determining and Quantifying Radiation for Practical Design Guidelines
Radiation is a vital mechanism affecting electromagnetic interference (EMI), noise control, and performance optimization in today's electronic designs. Due to tight electromagnetic compatibility standards, it becomes increasingly important to diagnosis the radiation hot spot in the radiation process before the mitigation is applied. In this paper, the characteristic mode analysis has been implemented together with the integral equation based numerical methods to identify the hot spots for EMI radiation. During this process, the current is split into radiating and nonradiating ones. The radiated power from each part of the structure can be quantified using the radiating current. Therefore, the radiation hot spot can be identified. Several numerical examples are applied to benchmark the proposed approach. This paper provides a guideline in discovering radiation related geometrical features, and designing methodologies for real geometries.
Y. S. Cao et al., "Quantifying EMI: A Methodology for Determining and Quantifying Radiation for Practical Design Guidelines," IEEE Transactions on Electromagnetic Compatibility, vol. 59, no. 5, pp. 1424 - 1432, Institute of Electrical and Electronics Engineers (IEEE), Oct 2017.
The definitive version is available at https://doi.org/10.1109/TEMC.2017.2677199
Electrical and Computer Engineering
Electromagnetic Compatibility (EMC) Laboratory
National Science Foundation (U.S.)
Research Grants Council (Hong Kong, China)
National Natural Science Foundation (China)
University Grants Committee (Hong Kong, China)
Keywords and Phrases
Design; Electromagnetic Pulse; Integral Equations; Numerical Methods; Characteristic Modes; Electromagnetic Compatibility Standards; Electronic Design; Geometrical Features; Hot Spot; Performance Optimizations; Radiated Power; Radiation Process; Radiation; Characteristic Mode (CM) Analysis; Electromagnetic Interference (EMI); Radiation Hot Spot
International Standard Serial Number (ISSN)
Article - Journal
© 2017 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
01 Oct 2017
Thisworkwas supported in part by theNational Science Foundation under Grant IIP-1440110, in part by the Research Grants Council of Hong Kong (GRF 712612 and GRF 711511), in part by National Science Foundation of China (NSFC 61271158), in part by HKU Seed Fund 201309160052, and in part by Hong Kong UGC AoE/P-04/08.