EMI Reduction Evaluation with Flexible Absorbing Materials and Ferrite Cores Applied on Cables


Cables, represented by monopole antennas and coated with magneto-dielectric absorbing materials or containing ferrite cores, can be used to estimate how much electromagnetic interference (EMI) reduction the corresponding coatings cause. Two-dimensional finite element method (2D-FEM) has been developed to calculate the EMI reduction by taking advantage of the axial symmetry of the geometry. A standard technique based on the 7/3-mm coaxial air line and vector network analyzer measurements is used to extract the relative permeability and permittivity of the flexible absorbing materials or ferrites. With the extracted parameters, both the input impedance and the EMI reduction on cables coated with absorbing materials or containing a ferrite choke can be calculated by the 2D-FEM, and the input impedance is also compared with the experiment result. At last, EMI reduction values of absorbing sheet material and ferrite are evaluated by 2DFEM based on realist geometry of cables.

Meeting Name

IEEE International Symposium on Electromagnetic Compatibility (2012: Aug. 5-10, Pittsburgh, PA)


Electrical and Computer Engineering

Research Center/Lab(s)

Electromagnetic Compatibility (EMC) Laboratory

Keywords and Phrases

Absorbing Materials; Cable Applications; EMI Reductions; Ferrite Cores; Magneto-Dielectric; Material Parameter Extraction; Cables; Coated Materials; Electric Impedance; Electric Impedance Measurement; Electromagnetic Compatibility; Electromagnetic Pulse; Ferrite; Ferrite Devices; Ferrites; Finite Element Method; Gyrators; Magnetic Cores; Magnetos; Mechanical Permeability; Parameter Extraction; Dielectric Materials; Absorbing Material; Cable Application; EMI Reduction; Permeability; Permittivity

International Standard Book Number (ISBN)

978-1467320610; 978-1467320603

International Standard Serial Number (ISSN)

2158-1118; 2158-110X

Document Type

Article - Conference proceedings

Document Version


File Type





© 2012 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.

Publication Date

01 Aug 2012