Closed-Form Expressions for the Maximum Transient Noise Voltage Caused by an IC Switching Current on a Power Distribution Network
Closed-form expressions for transient power distribution network (PDN) noise caused by an IC switching current are derived for a PDN structure comprised of traces with decoupling capacitors. Criteria for identifying a dominant decoupling capacitor for an impulse switching current are also proposed. The derived PDN noise expressions are validated with measurements of currents at both local and bulk capacitors, the PDN impedance, and the total voltage noise in an operating consumer device.
J. Kim et al., "Closed-Form Expressions for the Maximum Transient Noise Voltage Caused by an IC Switching Current on a Power Distribution Network," IEEE Transactions on Electromagnetic Compatibility, vol. 54, no. 5, pp. 1112-1124, Institute of Electrical and Electronics Engineers (IEEE), Oct 2012.
The definitive version is available at https://doi.org/10.1109/TEMC.2012.2194786
Electrical and Computer Engineering
Electromagnetic Compatibility (EMC) Laboratory
National Science Foundation (U.S.)
Ulsan National Institute of Science and Technology
Keywords and Phrases
Bulk Capacitors; Closed-Form Expression; Consumer Devices; Decoupling Capacitor; Dynamic Noise; Power Distribution Network; Switching Currents; Transient Noise; Voltage Noise; Capacitors; Electric Current Measurement; Electric Network Analysis; Switching; Power Quality; Current Measurement; Design Guideline; Dynamic Noise; Power Distribution Network (PDN); Switching Current; Target Impedance
International Standard Serial Number (ISSN)
Article - Journal
© 2012 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
01 Oct 2012