Metrology & Methodology of System Level ESD Testing
Abstract
Parameters which cause the poor reproducibility of system level ESD tests have been identified: simulator calibration methodology and insufficient simulator specifications. Results of round robin tests we performed at three laboratories are reported. A better calibration methodology for ESD current measurement and additional simulator specifications for output current and radiated fields are proposed.
Recommended Citation
D. Lin et al., "Metrology & Methodology of System Level ESD Testing," Proceedings of the Electrical Overstress/Electrostatic Discharge Symposium (1998, Reno, NV), pp. 29 - 39, Institute of Electrical and Electronics Engineers (IEEE), Oct 1998.
The definitive version is available at https://doi.org/10.1109/EOSESD.1998.737019
Meeting Name
Electrical Overstress/Electrostatic Discharge Symposium (1998: Oct. 6-8, Reno, NV)
Department(s)
Electrical and Computer Engineering
Keywords and Phrases
Electric Current Measurement; Electric Discharges; Electromagnetic Fields; Electrostatics; Simulators; Electrostatic Discharge (ESD) Testing; Electronic Equipment Testing
International Standard Serial Number (ISSN)
0739-5159
Document Type
Article - Conference proceedings
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 1998 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
01 Oct 1998
