Broadband Measurement of the Conductivity and the Permittivity of Semiconducting Materials in High Voltage XLPE Cables

Abstract

The measurement of frequency dependent conductivity and permittivity in semiconducting materials was investigated in the high-voltage cross-linked polyethylene (XLPE) cables. The measurement set up was studied in order to determine the reflection coefficients. The semiconductor sample was analyzed in terms of impedance, calibration, accuracy and temperature control. The temperature dependence of these semiconducting layers of medium and high voltage cables was also reported.

Meeting Name

8th International Conference on Dielectric Materials, Measurements and Applications (2000: Sep. 17-21, Edinburgh, UK)

Department(s)

Electrical and Computer Engineering

Keywords and Phrases

Carbon Black; Electric Conductivity Measurement; Partial Discharges; Permittivity Measurement; Polyethylenes; Semiconductor Materials; Cross-linked Polyethylenes; Electric Cables

International Standard Book Number (ISBN)

0-85296-730-6

International Standard Serial Number (ISSN)

0537-9989

Document Type

Article - Conference proceedings

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2000 Institution of Engineering and Technology (IEE), All rights reserved.

Publication Date

01 Sep 2000

Link to Full Text

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