Sensitivity Analysis of a Single-Port Vector Reflectometer with a Wideband Phase-Shifter

Abstract

Sensitivity analysis is presented for wideband single-port vector reflectometers designed based on a noncoherent detection scheme. Simulations are performed to obtain the sensitivity of the systems to noise associated with the measured standing-wave voltage. The effect of insertion loss in phase-shifter, total phase shift and error in detector characterization on the accuracy of measuring the reflection coefficient of a device under test (DUT) is investigated. Results of this analysis are validated using measurements performed by custom-designed single-port reflectometer systems at X-band (8.2 x 12.4 GHz) and Ka-band (26.5 x 40 GHz).

Meeting Name

IEEE International Instrumentation and Measurement Technology Conference: Instrumentation and Measurement for Life (2013: May 6-9, Minneapolis, MN)

Department(s)

Electrical and Computer Engineering

Keywords and Phrases

Electronic Phase-Shifter; Insertion Loss; Microwave; Millimeter-Wave; Sensitivity Analysis; Vector Reflectometry; Device Under Test; Ka Band; Noncoherent Detection; Reflectometry; Standing Wave; Wide-Band; Design For Testability; Reflection; Measurements

International Standard Book Number (ISBN)

978-1467346221

International Standard Serial Number (ISSN)

1091-5281

Document Type

Article - Conference proceedings

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2013 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.

Publication Date

01 May 2013

Link to Full Text

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