Sensitivity Analysis of a Single-Port Vector Reflectometer with a Wideband Phase-Shifter
Sensitivity analysis is presented for wideband single-port vector reflectometers designed based on a noncoherent detection scheme. Simulations are performed to obtain the sensitivity of the systems to noise associated with the measured standing-wave voltage. The effect of insertion loss in phase-shifter, total phase shift and error in detector characterization on the accuracy of measuring the reflection coefficient of a device under test (DUT) is investigated. Results of this analysis are validated using measurements performed by custom-designed single-port reflectometer systems at X-band (8.2 x 12.4 GHz) and Ka-band (26.5 x 40 GHz).
A. Kothari et al., "Sensitivity Analysis of a Single-Port Vector Reflectometer with a Wideband Phase-Shifter," Proceedings of the IEEE International Instrumentation and Measurement Technology Conference: Instrumentation and Measurement for Life (2013, Minneapolis, MN), pp. 381 - 386, Institute of Electrical and Electronics Engineers (IEEE), May 2013.
The definitive version is available at https://doi.org/10.1109/I2MTC.2013.6555444
IEEE International Instrumentation and Measurement Technology Conference: Instrumentation and Measurement for Life (2013: May 6-9, Minneapolis, MN)
Electrical and Computer Engineering
Keywords and Phrases
Electronic Phase-Shifter; Insertion Loss; Microwave; Millimeter-Wave; Sensitivity Analysis; Vector Reflectometry; Device Under Test; Ka Band; Noncoherent Detection; Reflectometry; Standing Wave; Wide-Band; Design For Testability; Reflection; Measurements
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Article - Conference proceedings
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01 May 2013