Effect of Human Activities and Environmental Conditions on Electrostatic Charging
The generation of electrostatic charge is considered for the cases of standing up from a chair and removing a garment at dew points with temperature and relative humidity (RH) of -13.1 °C (5 °C, RH 25%), -10 °C (27 °C, RH 8%), -8.9 °C (18 °C, RH 15%), -1.7 °C (38 °C, RH 8%), 5 °C (27 °C, RH 25%), 5.6 °C (18 °C, RH 45%), and 13.9 °C (27 °C, RH 45%). Using ESD mitigation shoes/floors rather than non-ESD can reduce the voltages by a factor of ~2 to 5 for garment removal and ~2 to 7 for standing up from a chair. For the garment removal, the charge voltage will drop to 100 V within ~0.5 to 6 s and within ~1 to 30 min when ESD and non-ESD mitigation shoes/floors are used, respectively. For the standing-up form a chair, the corresponding times are ~0.5 to 3 s and ~1 to 4 min, respectively. For the extreme case at 22 °C, RH 5%, the voltage can surpass +/- 20 kV. Finally, it is shown that the voltages a person will charge up to may vary by +/- 30% just because of different capacitances to ground. Residential home settings will lead to the highest voltages (60 pF test person to ground, U.S. wood frame house), while standing on a concrete floor only half of the voltage may be reached (120 pF).
A. Talebzadeh et al., "Effect of Human Activities and Environmental Conditions on Electrostatic Charging," IEEE Transactions on Electromagnetic Compatibility, vol. 58, no. 4, pp. 1266-1273, Institute of Electrical and Electronics Engineers (IEEE), Aug 2016.
The definitive version is available at https://doi.org/10.1109/TEMC.2016.2575842
Electrical and Computer Engineering
Electromagnetic Compatibility (EMC) Laboratory
Keywords and Phrases
Electrostatic devices; Electrostatic discharge; Electrostatics; Charge voltage; Concrete floor; Electrostatic charges; Electrostatic charging; Environmental conditions; Human activities; Residential homes; Temperature and relative humidity; Capacitance; ESD mitigation
International Standard Serial Number (ISSN)
Article - Journal
© 2016 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
01 Aug 2016